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Semiconsoft Thin film thickness measurement systemWe offer
PL-100 features a highly versatile, cost effective and high
Reflection measurement system using UV-VIS spectrometer in B
FL-100 features a highly versatile, cost effective and high
The XM-100-CC Motorized computer-controlled series of UV-VIS
FL-100-CC features a highly versatile, cost effective and fu
UV-VIS spectrometer Absorbance and Transmission setup using
Photoluminescence SpectrometerMaya Spectrometer Back thinn
Deuterium Tungsten Light sourceThe DH-2000 light source of