Description
Product details
MPROBE 20 UVVis Thickness measurement system MProbe20 UVViS is a desktop system for high precision measurement of thickness and refractive index of thin films. It is especially useful in measuring thickness and optical constants of materials with absorption edge in UV range. For example, metal oxide like TiO2, ZnO, etc. Measuring very thin films (< 50nm) is another application where UV range gives advantage. MProbe 20 UVVis capabilities overlap with that of MProbe 20 Vis system. But in these two applications UVVis system has an advantage over Vis system. MProbe 20 UVVis system is primarily used for R&D applications.
